Modified verify in a memory device

ABSTRACT

The non-volatile memory includes a control circuitry that is communicatively coupled to an array of memory cells that are arranged word lines. The control circuitry is configured to program the memory cells using a multi-pass programming operation which includes a first pass and a second pass. The first pass programs the memory cells to a first number of data states, and the second pass programs the memory cells to a greater second number of data states. For at least one word line, during the second pass, a voltage that is applied to at least one memory cell is reduced from a verify voltage by an offset which is determined as a function of a data state of an adjacent memory cell of an adjacent word line and wherein the first pass but not the second pass has been completed in the adjacent word line.

BACKGROUND 1. Field

The present technology relates to the operation of memory devices.

2. Related Art

Many memory devices are provided as internal, semiconductor, integrated circuits in computers or other electronic devices. There are many different types of memory, including random-access memory (RAM), read only memory (ROM), dynamic random-access memory (DRAM), synchronous dynamic random-access memory (SDRAM), an electrically erasable programmable read-only memory (EEPROM), a flash memory, and/or the like. In an EEPROM or flash NAND array architecture, memory cells may be arranged in a matrix of rows and columns such that gates of each memory cell are coupled by rows to word lines. The memory cells may be arranged together in strings such that memory cells in a given string are coupled together in series, from source to drain, between a common source line and a common bit line.

One known problem associated with the programming of such memory devices is neighboring word line interference (hereinafter referred to as “NWI”). NWI refers to the phenomenon where the programming voltage of a cell of a given word line (WLn) is affected by the programming of a cell of the next word line (WLn+1). In many cases, a voltage threshold Vth of the memory cell of WLn is increased, or upshifted, particularly if the memory cell of WLn+1 is programmed to a high data state. This problem may become more apparent as memory devices are scaled down in size and the space between neighboring memory cells decreases.

SUMMARY

The programming techniques of the present disclosure are provided to reduce the effects of NWI in a memory device.

One aspect of the present disclosure is related to a storage device that includes a non-volatile memory which includes a control circuitry that is communicatively coupled to an array of memory cells that are arranged in a plurality of word lines. The control circuitry is configured to program the memory cells of the word lines using a multi-pass programming operation. For each word line, the multi-pass programming operation includes a first pass and a second pass. The first pass programs the memory cells to a first number of data states, and the second pass programs the memory cells to a greater second number of data states. For at least one word line, during the second pass, a voltage that is applied to at least one memory cell is reduced from a verify voltage by an offset which is determined as a function of a data state of an adjacent memory cell of an adjacent word line and wherein the first pass but not the second pass has been completed in the adjacent word line.

In an embodiment, the multi-pass programming operation includes performing the first pass on a first word line of the plurality of word lines, performing the first pass on a second word line of the plurality of word lines. The second word line is adjacent the first word line. The programming operation further includes reading the second word line to determine the data states of the memory cells of the second word line after the first pass on the second word line has been completed and performing the second pass on the first word line using verify voltages that have been reduced by offsets which are determined based on the data states of the memory cells of the second word line.

In an embodiment, the first number of data states that are programmed during the first pass is a total of four data states including an erase data state and three programmed data states, and the second number of data states that are programmed during the second pass is sixteen total data states including the erase data state and fifteen programmed data states.

In an embodiment, the control circuitry is configured to separate the memory cells of the first word line into two groups prior to the step of performing the second pass on the first word line. The two groups include a first group and a second group. The first group includes the memory cells that are adjacent the memory cells of the second word line which are in the erase state, and the second group includes the memory cells that are adjacent the memory cells of the second word line which are in any of the three programmed data states.

In an embodiment, the verify voltages of the first group of memory cells are reduced by a first offset, and the verify voltages of the second group of memory cells are reduced by a second offset that has a greater magnitude than the first offset.

In an embodiment, each of the first and second passes includes a plurality of program loops, and each program loop includes applying a program pulse to at least one memory cell and applying at least one verify pulse to the at least one memory cell.

Another aspect of the present disclosure is related to a method of programming a memory device. The method includes providing a memory device that includes an array of memory cells arranged in a plurality of word lines including a first word line WLn and a second word line WLn+1 that is adjacent the first word line WLn. The method proceeds with performing a first pass of a multi-pass programming operation on the memory cells of the first word line WLn to program the memory cells of the first word line WLn to a first number of data states. The method continues with the step of performing the first pass on the memory cells of the second word line WLn+1 to program the memory cells of the second word line WLn+1 to the first number of data states. The method proceeds with the step of determining the data states of the memory cells of the second word line WLn+1. The method continues with the step of performing a second pass of the multi-pass programming operation on the first word line WLn to program the memory cells of the first word line WLn to a second number of data states that is greater than the first number of data states. The second pass includes applying verify pulses to the memory cells of the first word line WLn, and the verify pulses are at magnitudes that are determined based on the data states of the memory cells of the second word line WLn+1.

In an embodiment, the method further includes the step of assigning each of the memory cells of the first word line to one of at least two groups. The assignment is based on the data state of the memory cell of the second word line WLn+1 that is nearest the respective memory cell of the first word line WLn.

In an embodiment, the magnitudes of the verify pulses that are performed in the second pass of the first word line WLn are determined by subtracting an offset voltage from a predetermined verify voltage for data states being programmed.

In an embodiment, the at least two groups includes a first group and a second group. In an embodiment, the offset voltage of for memory cells of the first group is a first offset voltage, and the offset voltage for memory cells of the second group is a second offset voltage.

In an embodiment, the second offset voltage has a greater magnitude than the first offset voltage.

In an embodiment, the memory cells of the first word line WLn that are assigned to the first group are adjacent memory cells in the second word line WLn+1 that are in an erased data state, and the memory cells of the first word line WLn that are assigned to the second group are adjacent memory cells in the second word line WLn+1 that are in a programmed data state.

Yet another aspect of the present disclosure is related to an apparatus that includes a non-volatile memory with an array of memory cells that are arranged in a plurality of word lines. The plurality of word lines includes a first word line WLn and a second word line WLn+1 that is adjacent the first word line WLn. The apparatus further includes a control circuitry that is in electrical communication with the memory cells. The control circuitry is configured to perform a first pass of a multi-pass programming operation on the memory cells of the first word line WLn to program the memory cells of the first word line WLn to a first number of data states. The control circuitry is further configured to perform the first pass on the memory cells of the second word line WLn+1 to program the memory cells of the second word line WLn+1 to the first number of data states. The control circuitry is further configured to determine the data states of the memory cells of the second word line WLn+1 and perform a second pass of the multi-pass programming operation on the first word line WLn to program the memory cells of the first word line WLn to a second number of data states that is greater than the first number of data states. During the second pass, the control circuitry applies verify pulses to the memory cells of the first word line WLn. The verify pulses are at magnitudes that are determined based on the data states of the memory cells of the second word line WLn+1.

In an embodiment, the method further includes the step of assigning each of the memory cells of the first word line to one of at least two groups. The assignment is based on the data state of the memory cell of the second word line WLn+1 that is nearest the respective memory cell of the first word line WLn.

In an embodiment, the magnitudes of the verify pulses that are performed in the second pass of the first word line WLn are determined by subtracting an offset voltage from a predetermined verify voltage for data states being programmed.

In an embodiment, the at least two groups includes a first group and a second group. In an embodiment, the offset voltage of for memory cells of the first group is a first offset voltage, and the offset voltage for memory cells of the second group is a second offset voltage.

In an embodiment, the second offset voltage has a greater magnitude than the first offset voltage.

In an embodiment, the memory cells of the first word line WLn that are assigned to the first group are adjacent memory cells in the second word line WLn+1 that are in an erased data state, and the memory cells of the first word line WLn that are assigned to the second group are adjacent memory cells in the second word line WLn+1 that are in a programmed data state.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A is a block diagram of an example memory device;

FIG. 1B is a block diagram of an example control circuit;

FIG. 2 depicts blocks of memory cells in an example two-dimensional configuration of the memory array of FIG. 1A;

FIG. 3A and FIG. 3B depict cross-sectional views of example floating gate memory cells in NAND strings;

FIG. 4A and FIG. 4B depict cross-sectional views of example charge-trapping memory cells in NAND strings;

FIG. 5 depicts an example block diagram of the sense block SB1 of FIG. 1;

FIG. 6A is a perspective view of a set of blocks in an example three-dimensional configuration of the memory array of FIG. 1;

FIG. 6B depicts an example cross-sectional view of a portion of one of the blocks of FIG. 6A;

FIG. 6C depicts a plot of memory hole diameter in the stack of FIG. 6B;

FIG. 6D depicts a close-up view of region 722 of the stack of FIG. 6B;

FIG. 7A depicts a top view of an example word line layer WLL0 of the stack of FIG. 6B;

FIG. 7B depicts a top view of an example top dielectric layer DL19 of the stack of FIG. 6B;

FIG. 8A depicts example NAND strings in the sub-blocks SBa-SBd of FIG. 7A;

FIG. 8B depicts another example view of NAND strings in sub-blocks;

FIG. 9 illustrates the Vth distributions of the data states in a QLC memory system;

FIG. 10 illustrates the Vth distributions of the data states of memory cells during an exemplary embodiment of a two-pass programming technique;

FIG. 11 depicts a waveform of an example memory cell programming operation;

FIG. 12 is a schematic view illustrating a first word line WLn and a second word line WLn+1;

FIG. 13 is a flowchart of an example method of programming a plurality of memory cells in a memory device;

FIG. 14A illustrates a voltage threshold Vt window of a QLC memory system programmed according to one known programming operation; and

FIG. 14B illustrates a voltage threshold Vt window of a QLC memory system programmed according to a programming operation of the subject disclosure.

DETAILED DESCRIPTION

Techniques are provided for programming a memory device to protect the memory cells against NWI when utilizing a multi-pass programming technique. A corresponding memory device with corresponding programming circuits are also provided.

The following discussion is directed to various embodiments of the present disclosure. Although one or more of these embodiments may be preferred, the embodiments disclosed should not be interpreted, or otherwise used, as limiting the scope of the disclosure, including the claims. In addition, one skilled in the art will understand that the following description has broad application, and the discussion of any embodiment is meant only to be exemplary of that embodiment and not intended to intimate that the scope of the disclosure, including the claims, is limited to that embodiment.

A programming operation for a set of memory cells typically involves applying a series of program voltages to the memory cells after the memory cells are provided in an erased data state. Each program voltage is provided in a program loop, which is also referred to as a program-verify iteration. For example, the program voltages may be applied to a selected word line which is connected to control gates of the memory cells. In one approach, incremental step pulse programming is performed, where the program voltage is increased by a step size in each successive program loop. In each program loop, a verify operation is performed after the program voltage to determine whether the memory cells have completed programming. When programming is completed for a memory cell, it may be locked out (inhibited) from further programming while programming continues for other memory cells in subsequent program loops.

Each memory cell may be associated with a data state according to write data in a program command. A memory cell may be in an erased data state or may be programmed to a programmed data state that is different than the erased data state. With reference to FIG. 9, in an example four-bit per cell memory device, there are sixteen total data states, including the erased data state ER and fifteen programmed data states, referred to as the S1, S2, S3, S4, S5, S6, S7, S8, S9, S10, S11, S12, S13, S14, and S15 data states.

When a program command is issued, the write data is stored in latches associated with the memory cells. During programming, the latches of a memory cell may be read to determine the data state to which the memory cell is to be programmed. Each programmed data state is associated with a predetermined verify voltage such that a memory cell is considered to have completed programming when a read (sense) operation determines its threshold voltage (Vth) is above the associated verify voltage. In FIG. 9, the verify voltages are identified as Vv1-Vv15 for the S1-S15 data states respectively. A read (sense) operation may determine whether a memory cell has a Vth above the associated verify voltage by applying the associated verify voltage to the control gate and sensing a current through the memory cell. If the current is relatively high, this indicates that the memory cell is in a conductive state, such that the Vth is less than the control gate voltage. If the current is relatively low, this indicates that the memory cell is in a non-conductive state, such that Vth is above the control gate voltage.

Multi-pass programming, which is discussed in further detail below, may be used to tighten voltage distributions as compared to full sequence, or single-pass programming operations. Nonetheless, multi-pass programming operations may still be susceptible to NWI. For example, while a selected memory cell is being programmed or verified, neighboring memory cells may cause electron migration or disturbance on the selected memory cell from a memory cell of a neighboring word line or may cause electron migration from the memory cell of the neighboring word line to the selected memory cell. The result from this NWI may be an reduced Vt window, which is a range of voltage thresholds across the programmed data states.

One or more systems and/or methods described herein provide a verify operation in a multi-pass programming operation that compensates for NWI by, in a second pass of a multi-pass programming operation, biasing the voltage of a verify voltage pulse as a function of the data state of the memory cell of a neighboring word line, which has completed the first pass. This results in an increased/improved Vt window across the word line when programming of all data states has been completed.

FIG. 1A is a block diagram of an example memory device. The memory device 100 may include one or more memory die 108. The memory die 108 includes a memory structure 126 of memory cells, such as an array of memory cells, control circuitry 110, and read/write circuits 128. The memory structure 126 is addressable by word lines via a row decoder 124 and by bit lines via a column decoder 132. The read/write circuits 128 include multiple sense blocks SB1, SB2, . . . SBp (sensing circuitry) and allow a page of memory cells to be read or programmed in parallel. Typically, a controller 122 is included in the same memory device 100 (e.g., a removable storage card) as the one or more memory die 108. Commands and data are transferred between the host 140 and controller 122 via a data bus 120, and between the controller and the one or more memory die 108 via lines 118.

The memory structure 126 can be two-dimensional or three-dimensional. The memory structure 126 may comprise one or more array of memory cells including a three-dimensional array. The memory structure 126 may comprise a monolithic three-dimensional memory structure in which multiple memory levels are formed above (and not in) a single substrate, such as a wafer, with no intervening substrates. The memory structure 126 may comprise any type of non-volatile memory that is monolithically formed in one or more physical levels of arrays of memory cells having an active area disposed above a silicon substrate. The memory structure 126 may be in a non-volatile memory device having circuitry associated with the operation of the memory cells, whether the associated circuitry is above or within the substrate.

The control circuitry 110 cooperates with the read/write circuits 128 to perform memory operations on the memory structure 126, and includes a state machine 112, an on-chip address decoder 114, and a power control module 116. The state machine 112 provides chip-level control of memory operations.

A storage region 113 may, for example, be provided for programming parameters. The programming parameters may include a program voltage, a program voltage bias, position parameters indicating positions of memory cells, contact line connector thickness parameters, a verify voltage, and/or the like. The position parameters may indicate a position of a memory cell within the entire array of NAND strings, a position of a memory cell as being within a particular NAND string group, a position of a memory cell on a particular plane, and/or the like. The contact line connector thickness parameters may indicate a thickness of a contact line connector, a substrate or material that the contact line connector is comprised of, and/or the like.

The on-chip address decoder 114 provides an address interface between that used by the host or a memory controller to the hardware address used by the decoders 124 and 132. The power control module 116 controls the power and voltages supplied to the word lines and bit lines during memory operations. It can include drivers for word lines, SGS and SGD transistors, and source lines. The sense blocks can include bit line drivers, in one approach. An SGS transistor is a select gate transistor at a source end of a NAND string, and an SGD transistor is a select gate transistor at a drain end of a NAND string.

In some embodiments, some of the components can be combined. In various designs, one or more of the components (alone or in combination), other than memory structure 126, can be thought of as at least one control circuit which is configured to perform the actions described herein. For example, a control circuit may include any one of, or a combination of, control circuitry 110, state machine 112, decoders 114/132, power control module 116, sense blocks SBb, SB2, . . . , SBp, read/write circuits 128, controller 122, and so forth.

The control circuits can include a programming circuit configured to perform a program and verify operation for one set of memory cells, wherein the one set of memory cells comprises memory cells assigned to represent one data state among a plurality of data states and memory cells assigned to represent another data state among the plurality of data states; the program and verify operation comprising a plurality of program and verify iterations; and in each program and verify iteration, the programming circuit performs programming for the one word line after which the programming circuit applies a verification signal to the one word line. The control circuits can also include a counting circuit configured to obtain a count of memory cells which pass a verify test for the one data state. The control circuits can also include a determination circuit configured to determine, based on an amount by which the count exceeds a threshold, a particular program and verify iteration among the plurality of program and verify iterations in which to perform a verify test for another data state for the memory cells assigned to represent another data state.

For example, FIG. 1B is a block diagram of an example control circuit 150 which comprises a programming circuit 151, a counting circuit 152, and a determination circuit 153.

The off-chip controller 122 may comprise a processor 122 c, storage devices (memory) such as ROM 122 a and RAM 122 b and an error-correction code (ECC) engine 245. The ECC engine can correct a number of read errors which are caused when the upper tail of a Vth distribution becomes too high. However, uncorrectable errors may exist in some cases. The techniques provided herein reduce the likelihood of uncorrectable errors.

The storage device(s) 122 a, 122 b comprise, code such as a set of instructions, and the processor 122 c is operable to execute the set of instructions to provide the functionality described herein. Alternately or additionally, the processor 122 c can access code from a storage device 126 a of the memory structure 126, such as a reserved area of memory cells in one or more word lines. For example, code can be used by the controller 122 to access the memory structure 126 such as for programming, read and erase operations. The code can include boot code and control code (e.g., set of instructions). The boot code is software that initializes the controller 122 during a booting or startup process and enables the controller 122 to access the memory structure 126. The code can be used by the controller 122 to control one or more memory structures 126. Upon being powered up, the processor 122 c fetches the boot code from the ROM 122 a or storage device 126 a for execution, and the boot code initializes the system components and loads the control code into the RAM 122 b. Once the control code is loaded into the RAM 122 b, it is executed by the processor 122 c. The control code includes drivers to perform basic tasks such as controlling and allocating memory, prioritizing the processing of instructions, and controlling input and output ports.

Generally, the control code can include instructions to perform the functions described herein including the steps of the flowcharts discussed further below and provide the voltage waveforms including those discussed further below.

In one embodiment, the host is a computing device (e.g., laptop, desktop, smartphone, tablet, digital camera) that includes one or more processors, one or more processor readable storage devices (RAM, ROM, flash memory, hard disk drive, solid state memory) that store processor readable code (e.g., software) for programming the one or more processors to perform the methods described herein. The host may also include additional system memory, one or more input/output interfaces and/or one or more input/output devices in communication with the one or more processors.

Other types of non-volatile memory in addition to NAND flash memory can also be used.

Semiconductor memory devices include volatile memory devices, such as dynamic random access memory (“DRAM”) or static random access memory (“SRAM”) devices, non-volatile memory devices, such as resistive random access memory (“ReRAM”), electrically erasable programmable read only memory (“EEPROM”), flash memory (which can also be considered a subset of EEPROM), ferroelectric random access memory (“FRAM”), and magnetoresistive random access memory (“MRAM”), and other semiconductor elements capable of storing information. Each type of memory device may have different configurations. For example, flash memory devices may be configured in a NAND or a NOR configuration.

The memory devices can be formed from passive and/or active elements, in any combinations. By way of non-limiting example, passive semiconductor memory elements include ReRAM device elements, which in some embodiments include a resistivity switching storage element, such as an anti-fuse or phase change material, and optionally a steering element, such as a diode or transistor. Further by way of non-limiting example, active semiconductor memory elements include EEPROM and flash memory device elements, which in some embodiments include elements containing a charge storage region, such as a floating gate, conductive nanoparticles, or a charge storage dielectric material.

Multiple memory elements may be configured so that they are connected in series or so that each element is individually accessible. By way of non-limiting example, flash memory devices in a NAND configuration (NAND memory) typically contain memory elements connected in series. A NAND string is an example of a set of series-connected transistors comprising memory cells and SG transistors.

A NAND memory array may be configured so that the array is composed of multiple memory strings in which a string is composed of multiple memory elements sharing a single bit line and accessed as a group. Alternatively, memory elements may be configured so that each element is individually accessible, e.g., a NOR memory array. NAND and NOR memory configurations are examples, and memory elements may be otherwise configured. The semiconductor memory elements located within and/or over a substrate may be arranged in two or three dimensions, such as a two-dimensional memory structure or a three-dimensional memory structure.

In a two-dimensional memory structure, the semiconductor memory elements are arranged in a single plane or a single memory device level. Typically, in a two-dimensional memory structure, memory elements are arranged in a plane (e.g., in an x-y direction plane) which extends substantially parallel to a major surface of a substrate that supports the memory elements. The substrate may be a wafer over or in which the layer of the memory elements is formed or it may be a carrier substrate which is attached to the memory elements after they are formed. As a non-limiting example, the substrate may include a semiconductor such as silicon.

The memory elements may be arranged in the single memory device level in an ordered array, such as in a plurality of rows and/or columns. However, the memory elements may be arrayed in non-regular or non-orthogonal configurations. The memory elements may each have two or more electrodes or contact lines, such as bit lines and word lines.

A three-dimensional memory array is arranged so that memory elements occupy multiple planes or multiple memory device levels, thereby forming a structure in three dimensions (i.e., in the x, y and z directions, where the z-direction is substantially perpendicular and the x- and y-directions are substantially parallel to the major surface of the substrate).

As a non-limiting example, a three-dimensional memory structure may be vertically arranged as a stack of multiple two-dimensional memory device levels. As another non-limiting example, a three-dimensional memory array may be arranged as multiple vertical columns (e.g., columns extending substantially perpendicular to the major surface of the substrate, i.e., in the y direction) with each column having multiple memory elements. The columns may be arranged in a two-dimensional configuration, e.g., in an x-y plane, resulting in a three-dimensional arrangement of memory elements with elements on multiple vertically stacked memory planes. Other configurations of memory elements in three dimensions can also constitute a three-dimensional memory array.

By way of non-limiting example, in a three-dimensional array of NAND strings, the memory elements may be coupled together to form a NAND string within a single horizontal (e.g., x-y) memory device level. Alternatively, the memory elements may be coupled together to form a vertical NAND string that traverses across multiple horizontal memory device levels. Other three-dimensional configurations can be envisioned wherein some NAND strings contain memory elements in a single memory level while other strings contain memory elements which span through multiple memory levels. Three-dimensional memory arrays may also be designed in a NOR configuration and in a ReRAM configuration.

Typically, in a monolithic three-dimensional memory array, one or more memory device levels are formed above a single substrate. Optionally, the monolithic three-dimensional memory array may also have one or more memory layers at least partially within the single substrate. As a non-limiting example, the substrate may include a semiconductor such as silicon. In a monolithic three-dimensional array, the layers constituting each memory device level of the array are typically formed on the layers of the underlying memory device levels of the array. However, layers of adjacent memory device levels of a monolithic three-dimensional memory array may be shared or have intervening layers between memory device levels.

Then again, two-dimensional arrays may be formed separately and then packaged together to form a non-monolithic memory device having multiple layers of memory. For example, non-monolithic stacked memories can be constructed by forming memory levels on separate substrates and then stacking the memory levels atop each other. The substrates may be thinned or removed from the memory device levels before stacking, but as the memory device levels are initially formed over separate substrates, the resulting memory arrays are not monolithic three-dimensional memory arrays. Further, multiple two-dimensional memory arrays or three-dimensional memory arrays (monolithic or non-monolithic) may be formed on separate chips and then packaged together to form a stacked-chip memory device.

FIG. 2 illustrates schematic views of three types of memory architectures utilizing staggered memory strings. For example, reference number 201 shows a schematic view of a first example memory architecture, reference number 203 shows a schematic view of a second example memory architecture, and reference number 205 shows a schematic view of a third example memory architecture. In some embodiments, as shown, the memory architecture may include an array of staggered NAND strings.

FIG. 2 illustrates blocks 200, 210 of memory cells in an example two-dimensional configuration of the memory array 126 of FIG. 1. The memory array 126 can include many such blocks 200, 210. Each example block 200, 210 includes a number of NAND strings and respective bit lines, e.g., BL0, BL1, . . . which are shared among the blocks. Each NAND string is connected at one end to a drain-side select gate (SGD), and the control gates of the drain select gates are connected via a common SGD line. The NAND strings are connected at their other end to a source-side select gate (SGS) which, in turn, is connected to a common source line 220. Sixteen word lines, for example, WL0-WL15, extend between the SGSs and the SGDs. In some cases, dummy word lines, which contain no user data, can also be used in the memory array adjacent to the select gate transistors. Such dummy word lines can shield the edge data word line from certain edge effects.

One type of non-volatile memory which may be provided in the memory array is a floating gate memory, such as of the type shown in FIGS. 3A and 3B. However, other types of non-volatile memory can also be used. As discussed in further detail below, in another example shown in FIGS. 4A and 4B, a charge-trapping memory cell uses a non-conductive dielectric material in place of a conductive floating gate to store charge in a non-volatile manner. A triple layer dielectric formed of silicon oxide, silicon nitride and silicon oxide (“ONO”) is sandwiched between a conductive control gate and a surface of a semi-conductive substrate above the memory cell channel. The cell is programmed by injecting electrons from the cell channel into the nitride, where they are trapped and stored in a limited region. This stored charge then changes the threshold voltage of a portion of the channel of the cell in a manner that is detectable. The cell is erased by injecting hot holes into the nitride. A similar cell can be provided in a split-gate configuration where a doped polysilicon gate extends over a portion of the memory cell channel to form a separate select transistor.

In another approach, NROM cells are used. Two bits, for example, are stored in each NROM cell, where an ONO dielectric layer extends across the channel between source and drain diffusions. The charge for one data bit is localized in the dielectric layer adjacent to the drain, and the charge for the other data bit localized in the dielectric layer adjacent to the source. Multi-state data storage is obtained by separately reading binary states of the spatially separated charge storage regions within the dielectric. Other types of non-volatile memory are also known.

FIG. 3A illustrates a cross-sectional view of example floating gate memory cells 300, 310, 320 in NAND strings. In this Figure, a bit line or NAND string direction goes into the page, and a word line direction goes from left to right. As an example, word line 324 extends across NAND strings which include respective channel regions 306, 316 and 326. The memory cell 300 includes a control gate 302, a floating gate 304, a tunnel oxide layer 305 and the channel region 306. The memory cell 310 includes a control gate 312, a floating gate 314, a tunnel oxide layer 315 and the channel region 316. The memory cell 320 includes a control gate 322, a floating gate 321, a tunnel oxide layer 325 and the channel region 326. Each memory cell 300, 310, 320 is in a different respective NAND string. An inter-poly dielectric (IPD) layer 328 is also illustrated. The control gates 302, 312, 322 are portions of the word line. A cross-sectional view along contact line connector 329 is provided in FIG. 3B.

The control gate 302, 312, 322 wraps around the floating gate 304, 314, 321, increasing the surface contact area between the control gate 302, 312, 322 and floating gate 304, 314, 321. This results in higher IPD capacitance, leading to a higher coupling ratio which makes programming and erase easier. However, as NAND memory devices are scaled down, the spacing between neighboring cells 300, 310, 320 becomes smaller so there is almost no space for the control gate 302, 312, 322 and the IPD layer 328 between two adjacent floating gates 302, 312, 322.

As an alternative, as shown in FIGS. 4A and 4B, the flat or planar memory cell 400, 410, 420 has been developed in which the control gate 402, 412, 422 is flat or planar; that is, it does not wrap around the floating gate and its only contact with the charge storage layer 428 is from above it. In this case, there is no advantage in having a tall floating gate. Instead, the floating gate is made much thinner. Further, the floating gate can be used to store charge, or a thin charge trap layer can be used to trap charge. This approach can avoid the issue of ballistic electron transport, where an electron can travel through the floating gate after tunneling through the tunnel oxide during programming.

FIG. 4A depicts a cross-sectional view of example charge-trapping memory cells 400, 410, 420 in NAND strings. The view is in a word line direction of memory cells 400, 410, 420 comprising a flat control gate and charge-trapping regions as a two-dimensional example of memory cells 400, 410, 420 in the memory cell array 126 of FIG. 1. Charge-trapping memory can be used in NOR and NAND flash memory device. This technology uses an insulator such as an SiN film to store electrons, in contrast to a floating-gate MOSFET technology which uses a conductor such as doped polycrystalline silicon to store electrons. As an example, a word line 424 extends across NAND strings which include respective channel regions 406, 416, 426. Portions of the word line provide control gates 402, 412, 422. Below the word line is an IPD layer 428, charge-trapping layers 404, 414, 421, polysilicon layers 405, 415, 425, and tunneling layers 409, 407, 408. Each charge-trapping layer 404, 414, 421 extends continuously in a respective NAND string. The flat configuration of the control gate can be made thinner than a floating gate. Additionally, the memory cells can be placed closer together.

FIG. 4B illustrates a cross-sectional view of the structure of FIG. 4A along contact line connector 429. The NAND string 430 includes an SGS transistor 431, example memory cells 400, 433, . . . 435, and an SGD transistor 436. Passageways in the IPD layer 428 in the SGS and SGD transistors 431, 436 allow the control gate layers 402 and floating gate layers to communicate. The control gate 402 and floating gate layers may be polysilicon and the tunnel oxide layer may be silicon oxide, for instance. The IPD layer 428 can be a stack of nitrides (N) and oxides (0) such as in a N—O—N—O—N configuration.

The NAND string may be formed on a substrate which comprises a p-type substrate region 455, an n-type well 456 and a p-type well 457. N-type source/drain diffusion regions sd1, sd2, sd3, sd4, sd5, sd6 and sd7 are formed in the p-type well. A channel voltage, Vch, may be applied directly to the channel region of the substrate.

FIG. 5 illustrates an example block diagram of the sense block SB1 of FIG. 1. In one approach, a sense block comprises multiple sense circuits. Each sense circuit is associated with data latches. For example, the example sense circuits 550 a, 551 a, 552 a, and 553 a are associated with the data latches 550 b, 551 b, 552 b, and 553 b, respectively. In one approach, different subsets of bit lines can be sensed using different respective sense blocks. This allows the processing load which is associated with the sense circuits to be divided up and handled by a respective processor in each sense block. For example, a sense circuit controller 560 in SB1 can communicate with the set of sense circuits and latches. The sense circuit controller 560 may include a pre-charge circuit 561 which provides a voltage to each sense circuit for setting a pre-charge voltage. In one possible approach, the voltage is provided to each sense circuit independently, e.g., via the data bus and a local bus. In another possible approach, a common voltage is provided to each sense circuit concurrently. The sense circuit controller 560 may also include a pre-charge circuit 561, a memory 562 and a processor 563. The memory 562 may store code which is executable by the processor to perform the functions described herein. These functions can include reading the latches 550 b, 551 b, 552 b, 553 b which are associated with the sense circuits 550 a, 551 a, 552 a, 553 a, setting bit values in the latches and providing voltages for setting pre-charge levels in sense nodes of the sense circuits 550 a, 551 a, 552 a, 553 a. Further example details of the sense circuit controller 560 and the sense circuits 550 a, 551 a, 552 a, 553 a are provided below.

In some embodiments, a memory cell may include a flag register that includes a set of latches storing flag bits. In some embodiments, a quantity of flag registers may correspond to a quantity of data states. In some embodiments, one or more flag registers may be used to control a type of verification technique used when verifying memory cells. In some embodiments, a flag bit's output may modify associated logic of the device, e.g., address decoding circuitry, such that a specified block of cells is selected. A bulk operation (e.g., an erase operation, etc.) may be carried out using the flags set in the flag register, or a combination of the flag register with the address register, as in implied addressing, or alternatively by straight addressing with the address register alone.

FIG. 6A is a perspective view of a set of blocks 600 in an example three-dimensional configuration of the memory array 126 of FIG. 1. On the substrate are example blocks BLK0, BLK1, BLK2, BLK3 of memory cells (storage elements) and a peripheral area 604 with circuitry for use by the blocks BLK0, BLK1, BLK2, BLK3. For example, the circuitry can include voltage drivers 605 which can be connected to control gate layers of the blocks BLK0, BLK1, BLK2, BLK3. In one approach, control gate layers at a common height in the blocks BLK0, BLK1, BLK2, BLK3 are commonly driven. The substrate 601 can also carry circuitry under the blocks BLK0, BLK1, BLK2, BLK3, along with one or more lower metal layers which are patterned in conductive paths to carry signals of the circuitry. The blocks BLK0, BLK1, BLK2, BLK3 are formed in an intermediate region 602 of the memory device. In an upper region 603 of the memory device, one or more upper metal layers are patterned in conductive paths to carry signals of the circuitry. Each block BLK0, BLK1, BLK2, BLK3 comprises a stacked area of memory cells, where alternating levels of the stack represent word lines. In one possible approach, each block BLK0, BLK1, BLK2, BLK3 has opposing tiered sides from which vertical contacts extend upward to an upper metal layer to form connections to conductive paths. While four blocks BLK0, BLK1, BLK2, BLK3 are illustrated as an example, two or more blocks can be used, extending in the x- and/or y-directions.

In one possible approach, the length of the plane, in the x-direction, represents a direction in which signal paths to word lines extend in the one or more upper metal layers (a word line or SGD line direction), and the width of the plane, in the y-direction, represents a direction in which signal paths to bit lines extend in the one or more upper metal layers (a bit line direction). The z-direction represents a height of the memory device.

FIG. 6B illustrates an example cross-sectional view of a portion of one of the blocks BLK0, BLK1, BLK2, BLK3 of FIG. 6A. The block comprises a stack 610 of alternating conductive and dielectric layers. In this example, the conductive layers comprise two SGD layers, two SGS layers and four dummy word line layers DWLD0, DWLD1, DWLS0 and DWLS1, in addition to data word line layers (word lines) WLL0-WLL10. The dielectric layers are labelled as DL0-DL19. Further, regions of the stack 610 which comprise NAND strings NS1 and NS2 are illustrated. Each NAND string encompasses a memory hole 618, 619 which is filled with materials which form memory cells adjacent to the word lines. A region 622 of the stack 610 is shown in greater detail in FIG. 6D and is discussed in further detail below.

The 610 stack includes a substrate 611, an insulating film 612 on the substrate 611, and a portion of a source line SL. NS1 has a source-end 613 at a bottom 614 of the stack and a drain-end 615 at a top 616 of the stack 610. Contact line connectors (e.g., slits, such as metal-filled slits) 617, 620 may be provided periodically across the stack 610 as interconnects which extend through the stack 610, such as to connect the source line to a particular contact line above the stack 610. The contact line connectors 617, 620 may be used during the formation of the word lines and subsequently filled with metal. A portion of a bit line BL0 is also illustrated. A conductive via 621 connects the drain-end 615 to BL0.

FIG. 6C illustrates a plot of memory hole diameter in the stack of FIG. 6B. The vertical axis is aligned with the stack of FIG. 6B and illustrates a width (wMH), e.g., diameter, of the memory holes 618 and 619. The word line layers WLL0-WLL10 of FIG. 6A are repeated as an example and are at respective heights z0-z10 in the stack. In such a memory device, the memory holes which are etched through the stack have a very high aspect ratio. For example, a depth-to-diameter ratio of about 25-30 is common. The memory holes may have a circular cross-section. Due to the etching process, the memory hole width can vary along the length of the hole. Typically, the diameter becomes progressively smaller from the top to the bottom of the memory hole. That is, the memory holes are tapered, narrowing at the bottom of the stack. In some cases, a slight narrowing occurs at the top of the hole near the select gate so that the diameter becomes slightly wider before becoming progressively smaller from the top to the bottom of the memory hole.

Due to the non-uniformity in the width of the memory hole, the programming speed, including the program slope and erase speed of the memory cells can vary based on their position along the memory hole, e.g., based on their height in the stack. With a smaller diameter memory hole, the electric field across the tunnel oxide is relatively stronger, so that the programming and erase speed is relatively higher. One approach is to define groups of adjacent word lines for which the memory hole diameter is similar, e.g., within a defined range of diameter, and to apply an optimized verify scheme for each word line in a group. Different groups can have different optimized verify schemes.

FIG. 6D illustrates a close-up view of the region 622 of the stack 610 of FIG. 6B. Memory cells are formed at the different levels of the stack at the intersection of a word line layer and a memory hole. In this example, SGD transistors 680, 681 are provided above dummy memory cells 682, 683 and a data memory cell MC. A number of layers can be deposited along the sidewall (SW) of the memory hole 630 and/or within each word line layer, e.g., using atomic layer deposition. For example, each column (e.g., the pillar which is formed by the materials within a memory hole 630) can include a charge-trapping layer or film 663 such as SiN or other nitride, a tunneling layer 664, a polysilicon body or channel 665, and a dielectric core 666. A word line layer can include a blocking oxide/block high-k material 660, a metal barrier 661, and a conductive metal 662 such as Tungsten as a control gate. For example, control gates 690, 691, 692, 693, and 694 are provided. In this example, all of the layers except the metal are provided in the memory hole 630. In other approaches, some of the layers can be in the control gate layer. Additional pillars are similarly formed in the different memory holes. A pillar can form a columnar active area (AA) of a NAND string.

When a memory cell is programmed, electrons are stored in a portion of the charge-trapping layer which is associated with the memory cell. These electrons are drawn into the charge-trapping layer from the channel, and through the tunneling layer. The Vth of a memory cell is increased in proportion to the amount of stored charge. During an erase operation, the electrons return to the channel.

Each of the memory holes 630 can be filled with a plurality of annular layers comprising a blocking oxide layer, a charge trapping layer 663, a tunneling layer 664 and a channel layer. A core region of each of the memory holes 630 is filled with a body material, and the plurality of annular layers are between the core region and the word line in each of the memory holes 630.

The NAND string can be considered to have a floating body channel because the length of the channel is not formed on a substrate. Further, the NAND string is provided by a plurality of word line layers above one another in a stack, and separated from one another by dielectric layers.

FIG. 7A illustrates a top view of an example word line layer WLL0 of the stack 610 of FIG. 6B. As mentioned, a three-dimensional memory device can comprise a stack of alternating conductive and dielectric layers. The conductive layers provide the control gates of the SG transistors and memory cells. The layers used for the SG transistors are SG layers and the layers used for the memory cells are word line layers. Further, memory holes are formed in the stack and filled with a charge-trapping material and a channel material. As a result, a vertical NAND string is formed. Source lines are connected to the NAND strings below the stack and bit lines are connected to the NAND strings above the stack.

A block BLK in a three-dimensional memory device can be divided into sub-blocks, where each sub-block comprises a NAND string group which has a common SGD control line. For example, see the SGD lines/control gates SGD0, SGD1, SGD2 and SGD3 in the sub-blocks SBa, SBb, SBc and SBd, respectively. Further, a word line layer in a block can be divided into regions. Each region is in a respective sub-block and can extend between contact line connectors (e.g., slits) which are formed periodically in the stack to process the word line layers during the fabrication process of the memory device. This processing can include replacing a sacrificial material of the word line layers with metal. Generally, the distance between contact line connectors should be relatively small to account for a limit in the distance that an etchant can travel laterally to remove the sacrificial material, and that the metal can travel to fill a void which is created by the removal of the sacrificial material. For example, the distance between contact line connectors may allow for a few rows of memory holes between adjacent contact line connectors. The layout of the memory holes and contact line connectors should also account for a limit in the number of bit lines which can extend across the region while each bit line is connected to a different memory cell. After processing the word line layers, the contact line connectors can optionally be filed with metal to provide an interconnect through the stack.

In this example, there are four rows of memory holes between adjacent contact line connectors. A row here is a group of memory holes which are aligned in the x-direction. Moreover, the rows of memory holes are in a staggered pattern to increase the density of the memory holes. The word line layer or word line is divided into regions WLL0 a, WLL0 b, WLL0 c and WLL0 d which are each connected by a contact line 713. The last region of a word line layer in a block can be connected to a first region of a word line layer in a next block, in one approach. The contact line 713, in turn, is connected to a voltage driver for the word line layer. The region WLL0 a has example memory holes 710, 711 along a contact line 712. The region WLL0 b has example memory holes 714, 715. The region WLL0 c has example memory holes 716, 717. The region WLL0 d has example memory holes 718, 719. The memory holes are also shown in FIG. 7B. Each memory hole can be part of a respective NAND string. For example, the memory holes 710, 714, 716 and 718 can be part of NAND strings NS0_SBa, NS1_SBb, NS2_SBc, NS3_SBd, and NS4_SBe, respectively.

Each circle represents the cross-section of a memory hole at a word line layer or SG layer. Example circles shown with dashed lines represent memory cells which are provided by the materials in the memory hole and by the adjacent word line layer. For example, memory cells 820, 821 are in WLL0 a, memory cells 824, 825 are in WLL0 b, memory cells 826, 827 are in WLL0 c, and memory cells 828, 829 are in WLL0 d. These memory cells are at a common height in the stack.

Contact line connectors (e.g., slits, such as metal-filled slits) 801, 802, 803, 804 may be located between and adjacent to the edges of the regions WLL0 a-WLL0 d. The contact line connectors 801, 802, 803, 804 provide a conductive path from the bottom of the stack to the top of the stack. For example, a source line at the bottom of the stack may be connected to a conductive line above the stack, where the conductive line is connected to a voltage driver in a peripheral region of the memory device. See also FIG. 9A for further details of the sub-blocks SBa-SBd of FIG. 8A.

FIG. 8B illustrates a top view of an example top dielectric layer DL19 of the stack of FIG. 7B. The dielectric layer is divided into regions DL19 a, DL19 b, DL19 c and DL19 d. Each region can be connected to a respective voltage driver. This allows a set of memory cells in one region of a word line layer being programmed concurrently, with each memory cell being in a respective NAND string which is connected to a respective bit line. A voltage can be set on each bit line to allow or inhibit programming during each program voltage.

The region DL19 a has the example memory holes 710, 711 along a contact line 712, which is coincident with a bit line BL0. A number of bit lines extend above the memory holes and are connected to the memory holes as indicated by the “X” symbols. BL0 is connected to a set of memory holes which includes the memory holes 711, 715, 717, 719. Another example bit line BL1 is connected to a set of memory holes which includes the memory holes 710, 714, 716, 718. The contact line connectors (e.g., slits, such as metal-filled slits) 701, 702, 703, 704 from FIG. 7A are also illustrated, as they extend vertically through the stack. The bit lines can be numbered in a sequence BL0-BL23 across the DL19 layer in the x-direction.

Different subsets of bit lines are connected to memory cells in different rows. For example, BL0, BL4, BL8, BL12, BL16, BL20 are connected to memory cells in a first row of cells at the right-hand edge of each region. BL2, BL6, BL10, BL14, BL18, BL22 are connected to memory cells in an adjacent row of cells, adjacent to the first row at the right-hand edge. BL3, BL7, BL11, BL15, BL19, BL23 are connected to memory cells in a first row of cells at the left-hand edge of each region. BL1, BL5, BL9, BL13, BL17, BL21 are connected to memory cells in an adjacent row of memory cells, adjacent to the first row at the left-hand edge.

As discussed above, the programming operation may be a multi-pass programming operation in which the memory cells are programmed to their final programmed data states in two or more programming passes. One type of multi-pass programming operation is depicted in FIG. 10. In a first pass (hereinafter referred to as an “MLC pass”), rather than programming the memory cells of the word line to all of the programmed data states S1-S15, the memory cells are either left in the erase Er data state or are programmed to one of the S4, S6, and S12 data states. A relatively large voltage step size may be used in the first pass to reduce programming time. In a second pass (hereinafter referred to as a “fine pass”), the memory cells in the Er state are either left in the Er state or are programmed to the S1, S2, or S3 data states; the memory cells in the S4 data state are either left in the S4 data state or programmed to the S5, S10, or S11 data states; the memory cells in the S6 data state are either left in the S6 data state or programmed to the S7, S10, or S11 data states; and the memory cells of the S12 data state are either left in the S12 data state or are programmed to the S13, S14, or S15 data states. As discussed in further detail below, it has been found that programming the memory cells from the S4, S6, and S12 data states to their respective final states during the fine pass may have a larger NWI effect on the memory cells of the neighboring word lines than programming the memory cells from the Er state to the respective final states. Therefore, as also discussed in further detail below, to compensate for this difference, the voltages that are applied to the memory cells during the fine pass are reduced by an offset.

In some embodiments, the first pass may take different forms. For example, in one embodiment, in the MLC pass, the memory cells can be programmed to different data states than the S4, S6, and S12 data states as described above, or the first pass could be a TLC pass (as opposed to an MLC pass) where the memory cells are programmed to seven different programmed data states.

FIG. 11 depicts a waveform 1100 of an example memory cell programming operation that could be employed for either or both of the passes of the multi-pass operation depicted in FIG. 10. The horizontal axis depicts time, and the vertical axis depicts control gate or word line voltage. Generally, a programming operation can involve applying a pulse train to a selected word line, where the pulse train includes multiple program loops or program-verify iterations. Each program loop includes a programming Vpgm pulse and one or more verify pulses, depending on which data states are being programmed in a particular program loop. A square waveform is depicted for each pulse for simplicity; however, other shapes are possible, such as a multilevel shape or a ramped shape. Further, Incremental Step Pulse Programming (ISPP) is used in this example, in which the Vpgm pulse amplitude steps up in each successive program loop. This example uses ISPP in a single programming pass in which the programming is completed. ISPP can also be used in either or both programming passes of a multi-pass operation.

The pulse train includes Vpgm pulses that increase stepwise in amplitude with each program loop using a fixed step size (dVpgm). A new pulse train starts at an initial Vpgm pulse level and ends at a final Vpgm pulse level which does not exceed a maximum allowed level. The pulse train 1100 includes a series of Vpgm pulses 1101-1115 that are applied to a selected word line that includes a set of non-volatile memory cells. One or more verify voltage pulses 1116-1129 are provided after each Vpgm pulse as an example, based on the target data states which are being verified. The verify voltages correspond with the voltages Vv1-Vv15 (shown in FIG. 9) depending on the particular data states that are being programmed in a given program loop or may be reduced by an offset, as discussed in further detail below.

Referring now to FIG. 12, during a programming operation, the control circuitry may be configured to read the data states of the adjacent cells of neighboring word lines. For example, in this Figure, five memory cells MCA-MCE are depicted in word line WLn, and five memory cells MCF-MCJ are depicted in WLn+1. As shown, memory cell MCA of WLn is adjacent memory cell MCF of WLn+1, MCB of WLn is adjacent MCG of WLn+1, MCC of WLn is adjacent MCH of WLn+1, MCD of WLn is adjacent MCI of WLn+1, and MCE of WLn is adjacent MCJ of WLn+1. In some embodiments, the control circuitry may identify the data states of the memory cells in the neighboring word line by performing one or more read operations (sometimes referred to as sense operations). The control circuitry may, for example, perform a read operation of memory cells MCF-MCJ.

Referring now to FIG. 13, a flow chart depicting an exemplary programming operation for a memory block including a plurality of word lines is shown. The following steps can be executed by the control circuitry of the memory device. At step 1300, variable “n” is set to 0, and an MLC pass is performed on word line WLn, i.e., a first word line WL0. In other words, the memory cells of the first word line WL0 are either left in the erase data state or are programmed to the S4, S6, or S12 data states, depending on their respective final data states.

At step 1302, an MLC pass programming operation is performed on word line WLn+1, which is adjacent WLn.

After step 1302 is completed, at step 1304, the memory cells of word line WLn+1 are read to determine their respective data states. In this example, it is determined which of the memory cells of WLn+1 are in the Er, S4, S6, and S12 data states. In the example of FIG. 12, it is determined that memory cell MCF is in the S4 data state, MCG is in the Er data state, MCH is in the S12 data state, MCI is in the S6 data state, and MCJ is in the Er data state.

At step 1306, all of the memory cells of WLn are separated into two groups (hereinafter referred to as Group 1 and Group 2) based on the data states of the adjacent memory cells of WLn+1 as determined at step 1304. In one embodiment, a memory cell of WLn is put into Group 1 if the adjacent memory cell of WLn+1 is in the Er data state, and a memory cell of WLn is put into Group 2 if the adjacent memory cell of WLn+1 is in any of the S4, S6, or S12 data states. In some embodiments, the memory cells of WLn may be separated into more than two groups and/or the split may be determined differently. For example, in an alternate embodiment, Group 1 may include any memory cell adjacent a memory cell in the Er data state; Group 2 may include any memory cell adjacent a memory cell in the S4 or S6 data state; and Group 3 may include any memory cell adjacent a memory cell in the S12 data state.

In the example of FIG. 12, memory cells MCB and MCE are designated by the control circuitry as belonging to Group 1 because MCG and MCJ, which are adjacent memory cells MCB and MCE respectively, are both in the erase data state. Similarly, memory cells MCA, MCC, and MCD are separated by the control circuitry into Group 2 because MCF, MCH, and MCI are in the S4, S12, and S6 data states respectively.

At step 1308, for each of the memory cells of WLn, the control circuitry determines an offset voltage that the verify voltage is to be reduced by during the verify operations in the fine pass to follow. For each memory cell, the offset voltage that is applied is determined based on which of the Groups the respective memory cell is in. In other words, the verify voltage that is applied to each memory cell of WLn during the fine pass of WLn is reduced by the predetermined offset voltage, which itself is based on the data state of the memory cell of the adjacent word line WLn+1 after its MLC pass has been completed. In some embodiments, the control circuitry may determine one or more offset voltages by referencing a data structure that maps Groups 1 and 2 with offset voltage values. For example, the offset voltage for the memory cells of Group 1 may be DVCG_V1, and the offset voltage for the memory cells of Group 2 may be DVCG_V2. In one embodiment, the DVCG_V1 may be 12.5 mV, and DVCG_V2 may be 25 mV. However, other offset voltage magnitudes may be employed

In the example of FIG. 12, if memory cell MCA is being programmed to the S1 data state, then during programming of the S1 data state, the verify voltage that is applied to memory cell MCA is set as Vv1-DVCG_V2 because MCA belongs to Group 2. In another example, if memory cell MCB is being programmed to the S2 data state, then during programming of the S2 data state, the verify voltage that is applied to memory cell MCB is set as Vv2-DVCG_V1 because MCB belongs to Group 1.

In some embodiments, the offset voltage may offset a bit line voltage that is applied to the bit line coupled with a memory cell that is being programmed.

At step 1310, the control circuitry performs the fine pass programming operation on WLn using the offset verify voltages for the memory cells of WLn, as determined in step 1308.

At step 1312, it is determine if WLn+1 is the last word line to be programmed. If the answer at step 1312 is no, then at step 1314, n is incremented by one, i.e., n=n+1. The process then proceeds back to step 1302.

If the answer at step 1312 is yes, then at step 1316, the control circuitry performs the fine pass programming operation on word line WLn+1.

By offsetting the verify voltages that are applied during the MLC passes of the word lines, an impact that NWI has on the memory cells of the selected word line is reduced or eliminated. Thus, in comparison to other known programming operations (as represented in FIG. 14A), the programming operation discussed above (as represented in FIG. 14B) results in an increased Vt window across the programmed data states with little to no additional time or energy requirements.

The foregoing detailed description has been presented for purposes of illustration and description. It is not intended to be exhaustive or be limited to the precise form disclosed. Many modifications and variations are possible in light of the above description. The described embodiments were chosen to best explain the principles of the technology and its practical application to thereby enable others skilled in the art to best utilize the technology in various embodiments and with various modifications as are suited to the particular use contemplated. The scope of the technology is defined by the claims appended hereto. 

What is claimed is:
 1. A storage device, comprising: a non-volatile memory including a control circuitry that is communicatively coupled to an array of memory cells that are arranged in a plurality of word lines, wherein the control circuitry is configured to: program the memory cells of the plurality of word lines using a multi-pass programming operation, wherein for each word line, the multi-pass programming operation includes first and second passes and wherein the first pass programs the memory cells to a first number of data states and the second pass programs the memory cells from the first number of data states to a greater second number of data states, and wherein for at least one word line of the plurality of word lines, during the second pass, a verify voltage that is applied to at least one memory cell is reduced by an offset which is determined as a function of a data state of an adjacent memory cell of an adjacent word line, the first pass but not the second pass having been completed in the adjacent word line.
 2. The storage device as set forth in claim 1 wherein the multi-pass programming operation that the control circuitry is configured to perform includes: performing the first pass on a first word line of the plurality of word lines; performing the first pass on a second word line of the plurality of word lines, the second word line being adjacent the first word line; reading the second word line to determine the data states of the memory cells of the second word line after the first pass on the second word line has been completed; and performing the second pass on the first word line using verify voltages that have been reduced by offsets which are determined based on the data states of the memory cells of the second word line.
 3. The storage device as set forth in claim 2 wherein the first number of data states that are programmed during the first pass is a total of four data states including an erase data state and three programmed data states and wherein the second number of data states that are programmed during the second pass is sixteen total data states including the erase data state and fifteen programmed data states.
 4. The storage device as set forth in claim 3 wherein the control circuitry is configured to separate the memory cells of the first word line into two groups prior to the step of performing the second pass on the first word line, the two groups including: a first group that includes the memory cells of the first word line that are adjacent the memory cells of the second word line which are in the erase state, and a second group that includes the memory cells of the first word line that are adjacent the memory cells of the second word line which are in any of the three programmed data states.
 5. The storage device as set forth in claim 4 wherein the verify voltages of the first group of memory cells are reduced by a first offset and wherein the verify voltages of the second group of memory cells are reduced by a second offset, the second offset having a greater magnitude than the first offset.
 6. The storage device as set forth in claim 2 wherein each of the first and second passes includes a plurality of program loops, each program loop includes applying a program pulse to at least one memory cell and applying at least one verify pulse to the at one memory cell.
 7. A method of programming a memory device, comprising the steps of: providing a memory device that includes an array of memory cells arranged in a plurality of word lines including a first word line WLn and a second word line WLn+1 that is adjacent the first word line WLn; performing a first pass of a multi-pass programming operation on the memory cells of the first word line WLn to program the memory cells of the first word line WLn to a first number of data states; performing the first pass on the memory cells of the second word line WLn+1 to program the memory cells of the second word line WLn+1 to the first number of data states; determining the data states of the memory cells of the second word line WLn+1; and performing a second pass of the multi-pass programming operation on the first word line WLn to program the memory cells of the first word line WLn to a second number of data states that is greater than the first number of data states, the second pass including the applying verify pulses to the memory cells of the first word line WLn, the verify pulses being at magnitudes that are determined based on the data states of the memory cells of the second word line WLn+1.
 8. The method as set forth in claim 7 further including the step of assigning each of the memory cells of the first word line to one of at least two groups, the assignment being based on the data state of the memory cell of the second word line WLn+1 that is nearest the respective memory cell of the first word line WLn.
 9. The method as set forth in claim 8, wherein the magnitudes of the verify pulses that are performed in the second pass of the first word line WLn are determined by subtracting an offset voltage from a predetermined verify voltage for data states being programmed.
 10. The method as set forth in claim 9 wherein the at least two groups includes a first group and a second group.
 11. The method as set forth in claim 10 wherein the offset voltage for memory cells of the first group is a first offset voltage and wherein the offset voltage for memory cells of the second group is a second offset voltage.
 12. The method as set forth in claim 11 wherein the second offset voltage has a greater magnitude than the first offset voltage.
 13. The method as set forth in claim 10 wherein the memory cells of the first word line WLn that are assigned to the first group are adjacent memory cells in the second word line WLn+1 that are in an erased data state and wherein the memory cells of the first word line WLn that are assigned to the second group are adjacent memory cells in the second word line WLn+1 that are in a programmed data state.
 14. An apparatus, comprising: a non-volatile memory including an array of memory cells that are arranged in a plurality of word lines including a first word line WLn and a second word line WLn+1 that is adjacent the first word line WLn; control circuitry that is in electrical communication with the memory cells, the control circuitry being configured to; perform a first pass of a multi-pass programming operation on the memory cells of the first word line WLn to program the memory cells of the first word line WLn to a first number of data states, perform the first pass on the memory cells of the second word line WLn+1 to program the memory cells of the second word line WLn+1 to the first number of data states, determine the data states of the memory cells of the second word line WLn+1, and perform a second pass of the multi-pass programming operation on the first word line WLn to program the memory cells of the first word line WLn to a second number of data states that is greater than the first number of data states, the second pass including the applying verify pulses to the memory cells of the first word line WLn, the verify pulses being at magnitudes that are determined based on the data states of the memory cells of the second word line WLn+1.
 15. The apparatus as set forth in claim 14 wherein the control circuitry is further configured to assign each of the memory cells of the first word line to one of at least two groups, the assignment being based on the data state of the memory cell of the second word line WLn+1 that is nearest the respective memory cell of the first word line WLn.
 16. The apparatus as set forth in claim 15, wherein the control circuitry determines the magnitudes of the verify pulses that are performed in the second pass of the first word line WLn by subtracting an offset voltage from a predetermined verify voltage for data states being programmed.
 17. The apparatus as set forth in claim 16 wherein the at least two groups includes a first group and a second group.
 18. The apparatus as set forth in claim 17 wherein the offset voltage for memory cells of the first group is a first offset voltage and wherein the offset voltage for memory cells of the second group is a second offset voltage.
 19. The apparatus as set forth in claim 18 wherein the second offset voltage has a greater magnitude than the first offset voltage.
 20. The apparatus as set forth in claim 17 wherein the memory cells of the first word line WLn that are assigned to the first group are adjacent memory cells in the second word line WLn+1 that are in an erased data state and wherein the memory cells of the first word line WLn that are assigned to the second group are adjacent memory cells in the second word line WLn+1 that are in a programmed data state. 